Orientation Control and Dielectric Properties of Ba_0.6Sr_0.4TiO₃ Thin Films on Pt/Ti/SiO₂/Si Substrates with PbO Seeding Layer

Abstract:

Ba_0.6Sr_0.4TiO₃ (BST) thin films were fabricated by solgel technique on Pt/Ti/SiO₂/Si substrate without and with PbO seeding layer from precursor solutions with different concentrations. The crystal structure, surface morphology, dielectric properties and leakage current density of BST thin films are investigated as functions of the concentration of PbO precursor solution. Its found that the growth orientation of BST thin films with PbO seeding layer can be modulated through adjusting the concentration of PbO precursor solution. BST thin film with PbO seeding layer from 0.05 M precursor solution shows the highest dielectric constant and tunability, which may be attributed to the high crystallization and amplitude of the polarization in high (100) preferred orientated films. The leakage current density of BST films increases with the increasing concentration of PbO precursor solution and agrees well with the space-charge-limited current mechanism at room temperature.

• Periodical: Advanced Materials Research (Volume 741)
• Pages: 11-17
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.741.11
• Online since: August 2013
• Authors: Xiao Hua Sun, Ya Xia Qiao, Shuang Hou, Ying Yang, Cai Hua Huang
• Keywords: Dielectric Materials, Oriented Growth, Perovskites, X-Ray Diffraction (XRD)

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