Laser Far-Field Spot Test System

Abstract:

Measurement of the energy distribution of laser spots is an effective way in characterizing and diagnosing laser beam quality. After comparing conventional direct-detection and indirect-detection methods, a novel direct-detection scheme, which is based on detector-array controlled by single-chip microprocessors, is proposed. On the basis of analyzing key technologies such as data transmission and optical-electrical conversion, a block diagram of the system is proposed. In this system, a distributed structure was adopted which was composed of a host PC, a main microprocessor and lower microprocessors. This system is capable of measuring the parameters of laser beam in outfield such as size and shape of the spot, the energy of pulse and its distribution etc. It is suitable for most of lasers with repetition rate ranging from single pulse to several hundred per second and different energy up to moderate-high level. The system is more accurate than any former systems.

• Periodical: Advanced Materials Research (Volume 823)
• Pages: 331-334
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.823.331
• Online since: October 2013
• Authors: Yi Fei Ma
• Keywords: Direct Detection, Laser Spot, Outfield, Single-Chip Microprocessor

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