Determination of Coating Thickness by Crater Grounding Method

Xue Jiao Li; Cheng Zhang; Na Zhang; Shu Ting Miao; Dong Li Guo; Llian Hui Zhang

doi:10.4028/www.scientific.net/AMR.833.237

Paper Titles

Preparation and Mechanical Properties of TiN-Al₂O₃ Refractory Composites
p.217

Influence of the Binder Amount on the Properties of the Non-Sintering Ti(C,N)-Si₃N₄-SiC Composite Refractories
p.221

Application of High Radiative Coating on Hot Blast Stove and Heat Balance Calculation
p.225

Phase Transformation of Diatomite during Magnesiothermic Reduction Process
p.230

Determination of Coating Thickness by Crater Grounding Method
p.237

Study on the Performance of Aluminum Thick Film Contacts for Silicon Solar Cells
p.241

Preparation and Performance of Titanium Matrix Anodized Oxide Coating Anode Ru-Ir-Ti/Ti
p.247

Research Progress in Laser Clad Nickel-Based Alloy Coatings
p.252

Fabrication and Plasmas-Relevant Properties of B₄C/Cu Coating FGM
p.257

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 833Determination of Coating Thickness by Crater...

Determination of Coating Thickness by Crater Grounding Method

Abstract:

Coating thickness plays an important role in the performance of coated tools and machine parts. In the paper, a straightforward and simple method-crater grounding method is introduced to measure Zn coatings thickness. Coating section observation measurement are used to test the thickness, and the comparative result show that crater grounding method is accuracy vary within a certain error range. The influencing factors of this measuring method is analyzed in this paper.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 833)

Pages:

237-240

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.833.237

Citation:

Cite this paper

Online since:

November 2013

Authors:

Xue Jiao Li, Cheng Zhang, Na Zhang, Shu Ting Miao, Dong Li Guo, Llian Hui Zhang

Keywords:

Coating Thickness, Crater Grounding, Section Measurement

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] Paterson M J, Paterson P J K, Nissan B B. Dependence of structural and mechanical properties on film thickness in sol-gel zirconia films. Journal of Materials Research, 1998, 13(22): 388-395.

DOI: 10.1557/jmr.1998.0051

Google Scholar

[2] F. Roper, A high-frequency eddy current method for the thickness measurement of thin metallic foils using ferrite core transmission systems. NDT&E International, 2000, 33: 163~165.

DOI: 10.1016/s0963-8695(99)00033-x

Google Scholar

[3] Essam R. Shaaban, IshuKansal, S.H. Mohamed. Microstructural parameters and optical constants of Zn Tethin films with various thickness. Physica B. 2009, 404: 3571~3576.

DOI: 10.1016/j.physb.2009.06.002

Google Scholar

[4] J.C. Martinez-Anton, J.A. Gomez-Pedrero, A. Alvarez-Herrero. Envelope analysis in spectroscopic ellipsometry of thin films. Thin Solid Films 2004, 455 –456: 288~291.

DOI: 10.1016/j.tsf.2004.01.014

Google Scholar

[5] F.C. Lai, Y. Wang, M. Li, H.Q. Wang. Determination of optical constants and inhomogeneity of optical films by two-step film envelope method. Thin Solid Films. 2007, 515: 4763~4767.

DOI: 10.1016/j.tsf.2006.11.035

Google Scholar

[6] P. Hlubina, J. Lunacek, D. Ciprian. Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film. Optics and Lasers in Eng. 2010, 48: 786~791.

DOI: 10.1016/j.optlaseng.2010.03.003

Google Scholar