Data Processing Modeling for Reference Materials Preparation

Ting Zhang; Jia Li Gu

doi:10.4028/www.scientific.net/AMR.846-847.1334

Paper Titles

Modified PSO Algorithm for Solving the Eigenvalues of Matrix
p.1316

A Geometric Constraints Based Single-Image Reconstruction Method
p.1320

Recursive Enumeration K-Best Decoding Algorithm in Chinese Input Method Application
p.1326

The Process of Ant Algorithm for Solving the Degree-Constrained Euclidean Steiner Minimal Tree
p.1330

Data Processing Modeling for Reference Materials Preparation
p.1334

Face Image Segmentation Technology Research
p.1339

Identification of Dangerous Driving Behaviors Based on Neural Network and Bayesian Filter
p.1343

Information Reduction Model about Rough Set Theory
p.1347

Lettuce Images Features Extraction and Intelligent Classification of Growth Period
p.1351

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 846-847Data Processing Modeling for Reference Materials...

Data Processing Modeling for Reference Materials Preparation

Abstract:

This paper focuses on the data processing modeling for reference materials preparation. By analyzing the data of reference materials (RMs), the process of repeatability and stability verification, uncertainty estimation, traceability of the value of a quantity and the characterization of RMs are detailed in the paper.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Advanced Materials Research (Volumes 846-847)

Pages:

1334-1338

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.846-847.1334

Citation:

Cite this paper

Online since:

November 2013

Authors:

Ting Zhang*, Jia Li Gu

Keywords:

Data Processing, Reference Materials, Repeatability, Stability Verification, Uncertainty Estimation

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

* - Corresponding Author

References

[1] Senzu Shen, Ming Fang, Hua Li, Wenjun Chang and Liangwu Tang, Study of Certified Reference Material Preparation Technique for Microelectronic Digital Circuits, XIX IMEKO World Congress Fundamental and Applied Metrology, Lisbon, Portugal, pp.1242-1245, (2009).

Google Scholar

[2] Xiaojun Liang, Sanze Sun, Shisong Mao and Wen Liu, Statistical interpretation of data-Normality tests, International Organization For Standardization, (1997).

Google Scholar

[3] Zhenfan Yu, Wenxing Ding, Ming Chen, Guangzhu Fang, Jianguo Wu, Hengjian Cui and Yuzong Chen, Statistical interpretation of data-Detection and treatment of outliers in the normal sample, Standardization Administration of the People's Republic of China, (2009).

Google Scholar

[4] ZHANG Ting, SHI Jian, Characterization Model for IC Reference Material, 2011 International Conference on Frontiers of Manufacturing and Design Science, Taiwan.

Google Scholar