Dynamic Process of Quality Abnormal Pattern Recognition Based on PCA-SVM

Article Preview

Abstract:

Quality abnormal pattern recognition for dynamic process is the key problem to achieve the online quality control and diagnose of automatic production. In the practical applications, there are some existing problems such as computational complexity and low recognition accuracy. A recognition method for quality abnormal pattern of dynamic process with PCA-SVM was proposed. This paper proposes a feature selection technique that employs a principal component analysis, to avoid this information loss. Then, the extracted features were treated as input vector for SVM classifier, following a particle swarm optimization algorithm is proposed to improve the generalization performance of the recognizer. Simulation results show that the proposed algorithm has very high recognition accuracy and high generalization ability. It is significant for quality monitoring and diagnosis in manufacture dynamic process.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 860-863)

Pages:

2686-2689

Citation:

Online since:

December 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Chen,N., Zhou,S. Delectability study for statistical monitoring of multivariate dynamic processes. IIE Transactions. 2009; 41(7): 593–604.

DOI: 10.1080/07408170802389308

Google Scholar

[2] Shi,J., Zhou,S. Quality control and improvement for multistage systems: A survey. IIE Transactions. 2009; 41(9): 744–753.

DOI: 10.1080/07408170902966344

Google Scholar

[3] Qiang L, Tianyou C. Progress of data-driven and knowledge-driven process monitoring and fault diagnosis for industry process. Control and Decision. 2010; 25(6): 801–807.

Google Scholar

[4] Burges C. A tutorial on support vector machines for pattern recognition. Data Mining and Knowledge Discovery. 1998; 2(1): 21-67.

Google Scholar

[5] Shiyuan Y, Dehui W. Control Chart Pattern Recognition Based on PCA and SVM. Journal of System Simulation. 2006; 18(5): 1314–1318.

Google Scholar

[6] Xiaoxia Z. Support Vector Machine with Gauss Kernel Classified Method and Model Selection, Computer Engineering and Applications. 2006; (1): 76-79.

Google Scholar

[7] Xiao-kai G. Inertial navigation condition data analysis and establishment of diagnostic model based on SVM. Systems Engineering—Theory&Practice. 2012; 2(32): 405-410.

Google Scholar

[8] Shaohua J. Monitoring model based on kernel principal component analysis and multiple support vector machines and its application. Systems Engineering-Theory&Practice. 2009; 29(9): 153-159.

Google Scholar

[9] Vahid R., Ata E. Reza G. Application of the PSO-SVM model for recognition of control chart patterns. ISA Transactions. 2010; (49): 577-586.

DOI: 10.1016/j.isatra.2010.06.005

Google Scholar

[10] Hangkun W. The pattern recognition of control chart based on wavelet analysis and SVM. China Mechanical Engineering. 2010; 21(13): 1572-1576.

Google Scholar