RETRACTED: Correlation of the Transition Metal Compound Ternary Nitride Thin Films

Yong Jun Jiang

doi:10.4028/www.scientific.net/AMR.875-877.605

Paper Titles

Adhesion Assessment of BNT Films on Titanium Substrates Using a Scratch Test
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Measurement of the Speed of Sound in 2,3,3,3-Tetrafluoropropylene (R-1234yf) Liquid Phase with an Ultrasonic Sensor
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Eddy Current Defect Detection of Side Transverse Crack in Railhead by Integrating Experiment with Simulation
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Chracterizition of Dynamic Properties of Roof Bolts and their Applications
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RETRACTED: Correlation of the Transition Metal Compound Ternary Nitride Thin Films
p.605

Observation of Tamarind Gum Solubility in Aqueous Solution from Turbidity Measurement Technique
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FTIR Characterisation and Conductivity Studies of Undoped and Doped Conductive Polyene From Synthesize PVC with Sustainable Epoxidised Oil Coating Resin
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Water Penetration Resistance of Green Concrete Incorporating with Quarry Wastes
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Research of Interlaminar Defects of an Elliptic Form in Elements Designs from Layered Materials
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 875-877RETRACTED: Correlation of the Transition Metal...

RETRACTED: Correlation of the Transition Metal Compound Ternary Nitride Thin Films

Retracted:

The paper has been retracted due to plagiarism by editorial board request.
http://www.sciencedirect.com/science/article/pii/S0257897206008413

Abstract:

Thin films of MXN (M stands for early transition metal and X = Si, Ge, Sn) are studied as protective coatings. To extend the knowledge about the formation of nanocomposite films, various MXN systems have been compared. TiSiN, TiGeN, TiSnN, NbSiN, ZrSiN and CrSiN thin films were deposited by reactive magnetron sputtering, from confocal targets in a mixed Ar/N2 atmosphere. The chemical reactivity of germanium and tin with nitrogen is significantly lower than that of Si and Ti. Therefore, the TiGeN and TiSnN systems are different from TiSiN. Important changes in the morphology and structure of MXNfilms are induced by X addition. Nanocrystalline composite films are formed in all these investigated ternary systems.

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Periodical:

Advanced Materials Research (Volumes 875-877)

Pages:

605-608

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.875-877.605

Online since:

February 2014

Authors:

Yong Jun Jiang

Keywords:

Nitride, Thin Film, Transition Metal

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Creative Commons CC BY 4.0

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References

[1] M. Diserens, J. Patscheider, F. Lévy Surf. Coat. Technol., 108-109 (1998), p.241.

Google Scholar

[2] M. Benkahoul, C.S. Sandu, N. Tabet, M. Parlinska-Wojtan, A. Karimi, F. Lévy Surf. Coat. Technol., 188–189 (2004), p.435.

DOI: 10.1016/j.surfcoat.2004.08.048

Google Scholar

[3] F. Vaz, L. Rebouta, B. Almeida, P. Goudeau, J. Pacaud, J.P. Rivière, J. Bessa e SousaSurf. Coat. Technol., 120–121 (1999), p.166.

DOI: 10.1016/s0257-8972(99)00450-8

Google Scholar

[4] C.S. Sandu, R. Sanjinés, M. Benkahoul, M. Parlinska-Wojtan, A. Karimi, F. Lévy Thin Solid Films, 496 (2006), p.336.

DOI: 10.1016/j.tsf.2005.09.154

Google Scholar

[5] J. Patscheider, T. Zehnder, M. Diserens Surf. Coat. Technol., 146–147 (2001), p.201.

Google Scholar

[6] E. Martinez, R. Sanjines, O. Banakh, F. Levy Thin Solid Films, 447–448 (2004), p.332.

Google Scholar

[7] R. Sanjinés, M. Benkahoul, C.S. Sandu, F. Lévy J. Appl. Phys., 98 (2005), p.123511.

Google Scholar

[8] C.S. Sandu, M. Benkahoul, R. Sanjinés, F. Lévy, Surf. Coat. Technol. (in press).

Google Scholar

[9] C.S. Sandu, F. Medjani, R. Sanjinés, A. Karimi, F. LevySurf. Coat. Technol., 201 (2006), p.4219.

Google Scholar

[10] D. Pilloud, J.F. Pierson, A. Cavaleiro, M.C. Marco de Lucas Thin Solid Films, 492 (2005), p.180.

DOI: 10.1016/j.tsf.2005.06.051

Google Scholar

[11] J. Procházka, P. Karvánková, M.G.J. Vepřek-Heijman, S. Veprek Mater. Sci. Eng., A Struct. Mater.: Prop. Microstruct. Process., 384 (2004), p.102.

Google Scholar

[12] Hu. Xiaoping, Han Zenghu, Li Geyang, Gu Minguyan J. Vac. Sci. Technol., A, 20 (6) (2002), p. (1921).

Google Scholar