A Microscopic Image Sharpness Metric Based on the Local Binary Pattern (LBP)

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Abstract:

Microscopic image sharpness metric is very sensitive to illumination changes, so the research of sharpness metric methods which have better robustness to illumination is required. A new method which utilized the specialty of different orientation of Local Binary Pattern (LBP) is proposed. Firstly, the effective information and judge orientation of them at fixed region of the image is extracted. Secondly, different connected pattern is adopted to deal with different orientation region and the most robust LBP image is gotten. Finally, the sharpness metric is measured from the LBP image. The experiment results show that this method can inhibit the influence of illumination to microscopic image sharpness metric, and the stability can be improved by 83.89% averagely and 99.90% maximum.

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330-335

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February 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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