Surface Displacement Measurement of Soil Mass by White Light Digital Image Analysis in Frequency Domain

Jun Jun Li; Shi Zhu Yang; Wen Guang Shi

doi:10.4028/www.scientific.net/AMR.915-916.1234

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 915-916Surface Displacement Measurement of Soil Mass by...

Surface Displacement Measurement of Soil Mass by White Light Digital Image Analysis in Frequency Domain

Abstract:

The surface displacement of soil mass is an important standard for safety in civil engineering. In this paper, white light digital image analysis in frequency domain is introduced tomeasure surface displacement of soil mass. This method has the characteristics of whole-field, non-contact measurement and the simple measuring system and can obtain displacements by frequency domination correlation arithmetic. Surface displacements of soil mass are obtained by white light digital image analysis in frequency domain. Comparing the experimental results and the theoretical values, the little error exists and the usefulness of this method is certified.

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Periodical:

Advanced Materials Research (Volumes 915-916)

Pages:

1234-1237

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.915-916.1234

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Online since:

April 2014

Authors:

Jun Jun Li, Shi Zhu Yang*, Wen Guang Shi

Keywords:

Soil Mass, Surface Displacement, White Light Digital Image Analysis In Frequency Domain

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* - Corresponding Author

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