Seal Extraction Based on Clustering and Local Thresholding Techniques

Cheng Yun Wang; You Bin Chen

doi:10.4028/www.scientific.net/AMR.926-930.3467

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 926-930Seal Extraction Based on Clustering and Local...

Seal Extraction Based on Clustering and Local Thresholding Techniques

Abstract:

In this paper, we propose a method to extract seal imprints from bank document images based on color information. Firstly we use K-means clustering algorithm and local thresholding techniques to distinguish seal imprints from background areas. Secondly we wipe off printed characters and other noise upon the nearest neighbor classifier. Finally through a series of post-processing steps some missing pixels are added to the seal imprints. The result of our experiments proves that this method is capable of extracting Chinese seal imprints in most cases.

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Periodical:

Advanced Materials Research (Volumes 926-930)

Pages:

3467-3470

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.926-930.3467

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Online since:

May 2014

Authors:

Cheng Yun Wang*, You Bin Chen

Keywords:

Clustering, K-Mean, Local Threshold, Nearest Neighbor, Seal Extraction

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References

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