Design and Implementation of Automatic Test System of Digital Device

Ju Liang Zhang; Qing Chuang Deng; Yun Hua Hu

doi:10.4028/www.scientific.net/AMR.960-961.1168

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 960-961Design and Implementation of Automatic Test System...

Design and Implementation of Automatic Test System of Digital Device

Abstract:

Aiming at the digital device test, design a automatic test system, introduced the concept, architecture and technology. The PC sends SMV to digital device based on IEC61850-9-2, Then receive real data from device through the PC serial based on IEC103, constructing a loop, then completed the test. Software static structure adopts the modular programming, dynamic data exchange uses multithread. According to the configured test case, test items can be completed automatically. The system is based on PC, compared with the traditional test instrument to save hardware cost. With the help of calculation and control capabilities of the PC, realize the automatic testing, make people liberation from repetitive work, more focused on the analysis of test results, improve test quality and efficiency.

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Info:

Periodical:

Advanced Materials Research (Volumes 960-961)

Pages:

1168-1173

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.960-961.1168

Citation:

Cite this paper

Online since:

June 2014

Authors:

Ju Liang Zhang*, Qing Chuang Deng, Yun Hua Hu

Keywords:

Automatic Testing, Digital Device Test, IEC61580, Test System

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* - Corresponding Author

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