Neural Network Based Computer-Aided Process Design System for Wire Bonding Quality Improvement

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Abstract:

The relationship between the process parameters and bonding quality is very complicated due to the features of non-linear and coupling relation. It’s therefore hard to express their relationship in an exact mathematic model and very difficult to obtain an reasonable parameters setting to get high bonding quality. In this paper, a wire bonding process model based on BP(Back Propagation) neural network is proposed, and based on this model a computer-aided process design system for bonding quality improvement is developed through VC++6.0. Based on the training data from design of experiments (DoE), the BP network is built. The system is validated by test data and the testing result shows that the predicted error is samll and reasonable and the system developed can be used for parameter optimization and quality improvement.

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Periodical:

Advanced Materials Research (Volumes 97-101)

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2496-2499

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Online since:

March 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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[1] G.G. Harman, IEEE Transactions on Parts, Hybrids and Packaging, v PHP-13, n 4, pp.406-12(1977).

Google Scholar

[2] F.L. Wang, et al, Transactions of the China Welding Institution, 2006, 27(5): pp.47-52(In Chinese).

Google Scholar

[3] J. Gao, C.H. Liu, X. Chen, et al., Proceedings of International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009, Aug 10-13,Beijing, China.

DOI: 10.1109/icept.2008.4606931

Google Scholar

[4] Y.C. Tan, etc., K&S website: Kulicke & Soffa. Available at: http: /www. kns. com/SendFile. asp?TID =58&FID =14384, Accessed 20 May (2008).

Google Scholar

[5] D.T. Rooney, D. Nager, et al., Microelectronics Reliability 2005, 45: pp.379-390.

Google Scholar

[6] Y. Ding, J.K. Kim, P. Tong, Microelectronics Reliability, 2006, 46(7): pp.1101-1112 Sample No Sample No Shear force error(N) Diameter error(um).

Google Scholar