The Development of a Potentiometer Electric Parameter Comprehensive Test Instrument

Jing Ping Yuan; Fen Fen Yu

doi:10.4028/www.scientific.net/AMR.971-973.1383

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 971-973The Development of a Potentiometer Electric...

The Development of a Potentiometer Electric Parameter Comprehensive Test Instrument

Abstract:

This paper describes a sort of integrated tester controlled by STC series microcontroller that can be used to test simplex and duplex potentiometer’s total resistance, front and rear zero resistance, dynamic noise and duplex potentiometer synchronization feature. Multi-CPU parallel working mode is adopted by the tester. This paper mainly expounds the working principle of this test instrument, its software and hardware composition and the communication protocol between each part.

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Periodical:

Advanced Materials Research (Volumes 971-973)

Pages:

1383-1386

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.971-973.1383

Citation:

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Online since:

June 2014

Authors:

Jing Ping Yuan*, Fen Fen Yu

Keywords:

Comprehensive Test, Electrical Parameters, Potentiometer, STC Microcontroller

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* - Corresponding Author

References

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