Abstracts

Al-1%Si/TiN/Ti: Electromigration
a.388

Al-Si-Cu: Electromigration
a.389

(Al,Ti)₉₁Cr₉, (Al,Ti)₉₁Cu₉, (Al,Ti)₉₁Ni₉: Dislocations
a.390

Al₅₁Ti₄₇Mn₂: Dislocations
a.391

Au: Ion Implantation and Point Defects
a.392

Au: Surface Reconstruction
a.393

Au-Cu: Interdiffusion
a.394

Au-26.5at%Pt: Dislocations
a.395

Be, Fe-Cr-Ni (AISI316L, MANET), Mo, Mo- (TZM), V, W: T Permeation
a.396

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 123-124Au: Ion Implantation and Point Defects

Au: Ion Implantation and Point Defects

Page: A392