Grain Boundaries of Finite Length
a.518
a.518
Identification of the Fault Vectors of Planar Defects in the Sigma Phase
a.519
a.519
Anisotropic Migration of Two-Dimensional Grain Boundaries
a.520
a.520
Stacking Sequence Changes in Topologically Close-Packed Phases
a.521
a.521
Computer Simulation of Grain Boundary and Triple Junction Distributions in Microstructures Formed by Multiple Twinning
a.522
a.522
On the Impossibility of Pseudo-Twinning in B2 Alloys
a.523
a.523
A Critique of Some Concepts Regarding Planar Faults in Crystals
a.524
a.524
Defect-Like Nature of the Interface in AB/CD-Type Superlattices
a.525
a.525
Irradiation Effects, Dislocation Structure Formation due to Ion Implantation
a.526
a.526
Computer Simulation of Grain Boundary and Triple Junction Distributions in Microstructures Formed by Multiple Twinning
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