Abstracts

Enhanced Solubility of Impurities and Enhanced Diffusion near to Crystal Surfaces
a.466

Many-Body Nature of the Meyer-Neldel Compensation Law for Diffusion
a.467

Brownian Motion in Crystals with Topological Defects
a.468

Regime Diagram for Plasma-Driven Hydrogen Transport through Metals
a.469

Electromigration, Realistic Electromigration Lifetime Projection for Very Large-Scale Integration Interconnects
a.470

Point Defects, On the Contribution of Interstitial Migration to Radiation-Induced Segregation in Face-Centered Cubic Binary Alloys
a.471

Positron Methods for the Study of Defects in Bulk Materials
a.472

On the Effect of Bulk Vacancy Diffusion upon the Shape of Sputtered Films
a.473

Dynamics and Micro-Mechanisms of the Early Stages of Rigid Indenter Penetration into the Surface of Ionic Crystals
a.474

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 125-126Electromigration, Realistic Electromigration...

Electromigration, Realistic Electromigration Lifetime Projection for Very Large-Scale Integration Interconnects

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