Unsteady Thermoelastic Analysis of Dislocation Generation during Czochralski Crystal Growth
a.508
a.508
Planar Defects, A Mechanism for Twin Formation during the Czochralski and Bridgman Growth of III-V Compound Semiconductors
a.509
a.509
On the Structure and Properties of Grain Boundaries
a.510
a.510
Image Analysis for Geometrical Mismatch at Interfaces
a.511
a.511
Stress Fields Associated with Interfaces
a.512
a.512
Grain Boundaries of Finite Length
a.513
a.513
A General Procedure for Analyzing Stacking Faults and Antiphase Boundaries
a.514
a.514
Grain Boundary Inhomogeneity and Heterodiffusion
a.515
a.515
Multiplicity of Grain-Boundary Structures and Boundary Displacement Lattice
a.516
a.516
Stress Fields Associated with Interfaces
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