X-Ray Triple-Crystal Diffractometry of Defects in Epitaxial Layers
a.486
a.486
Simple Approach to the Calculation of Surface Defect Energies in Transition Metals
a.487
a.487
Defect Profiling in Elemental and Multi-Layer Systems - Correlations of Fitted Defect Concentrations with Positron Implantation Profiles
a.488
a.488
Defect Profiling in Multi-Layered Systems using Mean-Depth Scaling
a.489
a.489
Dynamic X-Ray Diffraction from Imperfect Crystals
a.490
a.490
Unified Theory of Defects in Insulators
a.491
a.491
Doping Puzzles in II-VI and III-V Semiconductors
a.492
a.492
Defect Studies with Isotopically-Designed Semiconductors
a.493
a.493
Surface Recombination in Semiconductors
a.494
a.494
Dynamic X-Ray Diffraction from Imperfect Crystals
Page: A490