Anomalous Charge Screening in the Radiation-Induced Recombination of Charged Defects in Ionic Solids
a.483
a.483
Activation of Shallow Dopants in II-VI Compounds
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a.484
Intrinsic Defects in II-VI Semiconductors
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a.485
Ductile Fracture via Vacancy Condensation in Face-Centered Cubic Single Crystals
a.486
a.486
Grouping of Point Defects in a Dislocation Core
a.487
a.487
Hydrogen-Related Defects in Crystalline Semiconductors
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a.488
Intrinsic and Extrinsic Defects in Semiconductors, Studied by Perturbed Angular Correlation Spectroscopy
a.489
a.489
Point Defects and Diffusion
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a.490
Role of Point Defects in Diffusion in Semiconductors
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a.491
Grouping of Point Defects in a Dislocation Core
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