Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography

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Periodical:

Defect and Diffusion Forum (Volumes 138-139)

Edited by:

David J. Fisher

Pages:

49-62

DOI:

10.4028/www.scientific.net/DDF.138-139.49

Citation:

S. Kimura et al., "Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography", Defect and Diffusion Forum, Vols. 138-139, pp. 49-62, 1996

Online since:

March 1996

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$35.00

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