Effect of Metallization-Induced Defects upon Metal/Semiconductor Contacts
a.598
a.598
Microscopic Theory of Colloid Formation in Solids under Irradiation
a.599
a.599
Effect of Magnetic Fields on Post-Implantation Damage in Superconducting Oxides
a.600
a.600
Atomic and Cluster Ion Bombardment in the Electronic Stopping Power Regime
a.601
a.601
Defect-Related Generation Current for Low-Dose Ion Implantation Monitoring
a.602
a.602
On the Measurement of Radiation-Induced Segregation at Point Defect Sinks
a.603
a.603
Ionic Conduction, Dependence of Ionic Conductivity Parameters upon Micro-Crystal Size
a.604
a.604
Mechanism of Proton Transport in Compounds with a Dynamically Disordered H-Bond Network
a.605
a.605
Lithium Ion-Conducting Crystalline Oxides
a.606
a.606
Defect-Related Generation Current for Low-Dose Ion Implantation Monitoring
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