High-Resolution Grazing-Incidence X-Ray Diffraction for the Characterization of Defects in Crystalline Surface Layers
a.413
a.413
Effective-Mass Effects in Localized Defects
a.414
a.414
Host-Lattice Scaling of Defect Quantum States
a.415
a.415
Dielectric and Electron Paramagnetic Double Resonance
a.416
a.416
Atomic Force Microscopy and Surface Atoms
a.417
a.417
First-Principles Modelling of Defects in Insulating Materials
a.418
a.418
Femtosecond Time-Resolved Spectroscopy of Halide Crystals
a.419
a.419
Relaxation Processes and Self-Trapping of Excitons in Rare-Gas Solids
a.420
a.420
p-Type Impurity Centers
a.421
a.421
Atomic Force Microscopy and Surface Atoms
Page: A417