Cu: Electromigration
a.238
a.238
Cu: Ion Implantation and Point Defects
a.239
a.239
Cu: Dislocations and Grain Boundaries
a.240
a.240
Cu, Ir, Rh: Dislocations and Stacking Faults
a.241
a.241
Cu3Au: Antiphase Boundaries and Grain Boundaries
a.242
a.242
CuAu, FePd, TiAl: Antiphase Boundaries
a.243
a.243
Cu-Zn-Al: Dislocations
a.244
a.244
Fe: C Diffusion
a.245
a.245
Fe-(25 or 30)at%Al: Dislocations
a.246
a.246
Cu3Au: Antiphase Boundaries and Grain Boundaries
Page: A242