Structures and Optical Properties of Defects Correlated with Photo-Induced Refractive Index Changes in Ge-Doped SiO2 Glass

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Periodical:

Defect and Diffusion Forum (Volumes 177-178)

Edited by:

D.J. Fisher

Pages:

43-50

DOI:

10.4028/www.scientific.net/DDF.177-178.43

Citation:

M. Fujimaki and Y. Ohki, "Structures and Optical Properties of Defects Correlated with Photo-Induced Refractive Index Changes in Ge-Doped SiO2 Glass", Defect and Diffusion Forum, Vols. 177-178, pp. 43-50, 2000

Online since:

February 2000

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$35.00

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