SiNx: Point Defects
a.273
SiNx/Si: Interface Defects
a.274
Si3N4: Dislocations and Stacking Faults
a.275
Si3N4: Point Defects
a.276
Si3N4: Stacking Faults
a.277
Si3N4: Surface Reconstruction
a.278
Si3N4/Si: Interface Defects
a.279
TaN: Cu Grain Boundary Diffusion
a.280