Dependence of Dislocation Image on Sample-to-Film Distance
a.230
a.230
Dislocation Contrast by Weak Reflections, and Determination of Burgers Vector
a.231
a.231
Recombination Contrast of Extended Defects in Modulated EBIC Technique
a.232
a.232
Electron Microscope Dislocation Images in Cubic and Non-Cubic Structures
a.233
a.233
Super-Screw Dislocation Contrast in Synchrotron White-Beam Topographs
a.234
a.234
X-Ray Line Broadening due to Dislocation Distribution
a.235
a.235
Dislocation-Induced Anisotropic Line Broadening in Rietveld Refinements
a.236
a.236
Dechannelling by Dislocations - a Time-Dependent Approach
a.237
a.237
Dechannelling by Dislocations - a Model Quantum-Mechanical Calculation
a.238
a.238
Super-Screw Dislocation Contrast in Synchrotron White-Beam Topographs
Page: A234