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Defect and Diffusion Forum
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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 179-180

Defect and Diffusion Forum Vols. 179-180

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.179-180

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Table of Contents

Abstract Title Page

Electron Microscope Dislocation Images in Cubic and Non-Cubic Structures

233

Super-Screw Dislocation Contrast in Synchrotron White-Beam Topographs

234

X-Ray Line Broadening due to Dislocation Distribution

235

Dislocation-Induced Anisotropic Line Broadening in Rietveld Refinements

236

Dechannelling by Dislocations - a Time-Dependent Approach

237

Dechannelling by Dislocations - a Model Quantum-Mechanical Calculation

238

Dislocation Images in Synchrotron Radiation Topographs

239

Interlayer Vortices and Edge Dislocations in High-Temperature Superconductors

240

Minority Carrier Recombination at Dislocations in Semiconductors

241

Enhancement of Superconductivity at Defects in Superconductors

242