Abstracts

Layer Growth in Thin-Film Binary Diffusion Couples
a.346

Simulation of Grain Boundary Structure and Diffusion
a.347

Properties of á/á+â Ternary Diffusion Couples
a.348

Dislocation Motion and Diffusing Solutes
a.349

Electromigration-Induced Stress and Stress-Dependent Diffusivity
a.350

Migration Energies in L1₂Compounds
a.351

Diffusion in Disordered Systems
a.352

Grain Boundary Diffusion in Stressed Thin Films
a.353

Diffusion Coefficient on a Crystal Surface
a.354

HomeDefect and Diffusion ForumDefects and Diffusion in Metals IIIElectromigration-Induced Stress and...

Electromigration-Induced Stress and Stress-Dependent Diffusivity

Page: A350