Controlled Ion Migration Tuning of Semiconductor Electrical Properties

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Periodical:

Edited by:

R.P. Agarwala

Pages:

61-98

DOI:

10.4028/www.scientific.net/DDF.191.61

Citation:

L. Chernyak and D. Cahen, "Controlled Ion Migration Tuning of Semiconductor Electrical Properties", Defect and Diffusion Forum, Vol. 191, pp. 61-98, 2001

Online since:

January 2001

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$35.00

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