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The Statistical Shift Model for the Meyer-Neldel Rule
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Meyer-Neldel Rule for the Kinetic Properties of Grain and Interphase Boundaries
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An Evaluation of Meyer-Neldel Behaviour for Hopping Mobilities in Amorphous Polymeric Materials
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Correlation of the Meyer-Neldel Rule and Persistent Photoconductivity in the Organic Semicondutor α-Sexithiophene
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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 192-193The Statistical Shift Model for the Meyer-Neldel...

The Statistical Shift Model for the Meyer-Neldel Rule

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The Meyer-Neldel Rule

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Periodical:

Defect and Diffusion Forum (Volumes 192-193)

Pages:

1-14

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.192-193.1

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Online since:

August 2001

Authors:

Harald Overhof, Peter Thomas

Keywords:

a-Si:H, DC Electronic Transport, Meyer-Neldel Rule, Mobility Edge, Staebler-Wronski Effect, Statistical Shift

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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