Extended Defect Migration in the Presence of Diffusing Impurities
a.525
a.525
Deformation-Induced Planar Dislocation Boundaries
a.526
a.526
Statistical Modelling of Dislocation Systems
a.527
a.527
Dislocation Modelling in Three-Dimensional Confined Volumes
a.528
a.528
Critical Epitaxial Film Thickness for Forming Interface Dislocations
a.529
a.529
Misfit Dislocations in Hollow Cylindrical Films on a Hole Surface
a.530
a.530
Discrete-Continuum Simulation of Dislocation Dynamics
a.531
a.531
Dislocation Plasticity and Crack-Tip Fields in Single Crystals
a.532
a.532
Quantitative Measurements of Dislocation Motion
a.533
a.533
Critical Epitaxial Film Thickness for Forming Interface Dislocations
Page: A529