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Abstracts
True Potentials and Transition Barriers at Dislocations
a.895
Strain and Slip Systems of Dislocations around Shallow Trench Isolation
a.896
Matthews and Blakeslee’s Critical Dislocation-Formation Thickness
a.897
Microchannel Epitaxy
a.898
Topological Analysis of Defects in Epitaxial Nitride Films and Interfaces
a.899
Deformation in Pentagonal Nanorods with Multiple Twin Boundaries
a.900
Grain Boundary Formation during Volmer–Weber Film Growth
a.901
Phase Transition Induced Antiphase Boundaries in Perovskites
a.902
Isothermal Transient Ionic Current in an Ion Conductor
a.903
HomeDefect and Diffusion ForumDefects and Diffusion in Ceramics VTopological Analysis of Defects in Epitaxial...

Topological Analysis of Defects in Epitaxial Nitride Films and Interfaces

Page: A899

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