Free Surface Relaxation and Two-Beam TEM Imaging of Straight Dislocations in Thin Foils

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Periodical:

Defect and Diffusion Forum (Volumes 224-225)

Edited by:

David Fisher

Pages:

1-12

DOI:

10.4028/www.scientific.net/DDF.224-225.1

Citation:

R. Bonnet et al., "Free Surface Relaxation and Two-Beam TEM Imaging of Straight Dislocations in Thin Foils ", Defect and Diffusion Forum, Vols. 224-225, pp. 1-12, 2004

Online since:

December 2003

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$35.00

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