Electromigration Induced Stress Analysis
a.480
a.480
Electromigration-Driven Motion of Morphologically Stable Voids
a.481
a.481
Grain Boundary Grooving under Capillary and Electromigration Forces
a.482
a.482
Saturated Voids due to Thermal Strains and Electromigration
a.483
a.483
Shape Evolution of Electromigration-Driven Single-Layer Islands
a.484
a.484
Thermodynamics of Triple Junctions and Electromigration Forces
a.485
a.485
Two-Dimensional Lump Nanosolitons for the Electromigration Equations
a.486
a.486
Atomistic Homogenization of Nanopatterned Point Defect Structures
a.487
a.487
Dynamic Defect Structure in Metals Subjected to Extreme Loading
a.488
a.488
Shape Evolution of Electromigration-Driven Single-Layer Islands
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