Surface Characterization of Irradiated Zno:Al Thin Film by Reactor Neutrons

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Abstract:

rradiation of ZnO:Al thin film by reactor neutrons with neutron/gamma ratio at 1.44x104 (n.cm-2.s-1.mR-1) leads to a decrease in resistivity in this material. The observed effects in electrical resistivity are attributed to irradiation-induced formation of defects in the ZnO:Al thin film structure.

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Defect and Diffusion Forum (Volumes 334-335)

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294-296

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February 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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