Paper Titles

Near Band-Edge and Deep-Level Related Luminescence Images near Dislocations in In-Alloyed Czochralski GaAs
p.1

Search for the Full Atomic Structure of EL2 in GaAs
p.9

Defect Related to Nitrogen Implantation in Silicon Single Crystals
p.21

Radiation Damage in Zirconium and its Alloys
p.29

Abstracts: Semiconductors
p.57

Abstracts: Halides
p.69

Abstracts: Oxides, Spinels, Garnets, and other Mixed Oxides
p.79

Abstracts: Carbon and Carbides
p.91

Abstracts: Sulfides and Selenides
p.95

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vol. 48Defect Related to Nitrogen Implantation in Silicon...

Defect Related to Nitrogen Implantation in Silicon Single Crystals

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Defect and Diffusion Forum Vol. 48

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Periodical:

Defect and Diffusion Forum (Volume 48)

Pages:

21-28

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.48.21

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Online since:

January 1987

Authors:

M. Bode, A. Jacubowicz, H.U. Habermeier

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© 1987 Trans Tech Publications Ltd. All Rights Reserved

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