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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 66-69Reaction Kinetics and Electromigration Threshold...

Reaction Kinetics and Electromigration Threshold in Aluminium Thin Films

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Diffusion in Metals and Alloys (DIMETA 88)

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Periodical:

Defect and Diffusion Forum (Volumes 66-69)

Pages:

1129-1142

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.66-69.1129

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Online since:

January 1990

Authors:

Evgeny E. Glickman, N.A. Osipov, E.D. Ivanov

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© 1990 Trans Tech Publications Ltd. All Rights Reserved

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