Microstructure and Magnetic Properties of Co Films on Si: Thickness and Roughness Dependence

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Edited by:

C.S. Kiminami and W.J. Botta Filho

Pages:

111-116

DOI:

10.4028/www.scientific.net/JMNM.14.111

Citation:

H. B. de Carvalho et al., "Microstructure and Magnetic Properties of Co Films on Si: Thickness and Roughness Dependence", Journal of Metastable and Nanocrystalline Materials, Vol. 14, pp. 111-116, 2002

Online since:

July 2002

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