Effect of Sintering Temperature on Microstructure and Critical Current Density of Nanocrystallined MgB2 Thick Films Prepared Using very Fast Formation Method

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Edited by:

Jung-Ho Ahn and Yoo-Dong Hahn

Pages:

349-354

DOI:

10.4028/www.scientific.net/JMNM.15-16.349

Citation:

A.H. Li et al., "Effect of Sintering Temperature on Microstructure and Critical Current Density of Nanocrystallined MgB2 Thick Films Prepared Using very Fast Formation Method", Journal of Metastable and Nanocrystalline Materials, Vols. 15-16, pp. 349-354, 2003

Online since:

April 2003

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$35.00

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