Microstructure and Interface Analyses of TiN Thin Films Deposited on M2 Speed Steel Substrate by Cathodic Arc Technique

Abstract:

Article Preview

Info:

Edited by:

C.S. Kiminami, C. Bolfarini and W.J. Botta F.

Pages:

654-658

DOI:

10.4028/www.scientific.net/JMNM.20-21.654

Citation:

R.A. Vieira and M. do C. de A. Nono, "Microstructure and Interface Analyses of TiN Thin Films Deposited on M2 Speed Steel Substrate by Cathodic Arc Technique", Journal of Metastable and Nanocrystalline Materials, Vols. 20-21, pp. 654-658, 2004

Online since:

July 2004

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.