Surface Characterisation of a Tin Oxide Nanosized Powder by FT-IR Spectrometry in Relation with the Semiconducting Properties

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Periodical:

Key Engineering Materials (Volumes 132-136)

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Edited by:

P. Abelard, J. Baxter, D. Bortzmeyer et al.

Pages:

1341-1344

DOI:

10.4028/www.scientific.net/KEM.132-136.1341

Citation:

J. Tribout et al., "Surface Characterisation of a Tin Oxide Nanosized Powder by FT-IR Spectrometry in Relation with the Semiconducting Properties", Key Engineering Materials, Vols. 132-136, pp. 1341-1344, 1997

Online since:

April 1997

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