Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis

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Periodical:

Edited by:

Pierluigi Priolo

Pages:

261-272

DOI:

10.4028/www.scientific.net/KEM.144.261

Citation:

F. Bertolino et al., "Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis", Key Engineering Materials, Vol. 144, pp. 261-272, 1998

Online since:

September 1997

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$35.00

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