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HomeKey Engineering MaterialsKey Engineering Materials Vol. 144Characterisation of an X-Ray System with GaAs...

Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis

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Experimental Techniques and Design in Composite Materials 3

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Periodical:

Key Engineering Materials (Volume 144)

Pages:

261-272

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.144.261

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Online since:

September 1997

Authors:

F. Bertolino, G. Gatto, F. Ginesu, P. Randaccio

Keywords:

Defect Analysis, Microtomography

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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