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HomeKey Engineering MaterialsKey Engineering Materials Vol. 188Characterisation of Modified Sputtered...

Characterisation of Modified Sputtered (TiAl)-Based Intermetallic Materials Doped with Silver and Chromium

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Development in Light Metals

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Periodical:

Key Engineering Materials (Volume 188)

Pages:

37-44

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.188.37

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Online since:

August 2000

Authors:

C. Coelho, Ana Sofia Ramos, Bruno Trindade, Maria-Teresa Freire Vieira, José Valdemar Fernandes, M. Vieira

Keywords:

Additional Elements, Thin Film, Titanium Aluminide, γ-Phase

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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