Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy

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Periodical:

Key Engineering Materials (Volumes 206-213)

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Edited by:

C. Kermel, V. Lardot, D. Libert and I. Urbain

Pages:

1025-1028

Citation:

N. Orlovskaya and Y.G. Gogotsi, "Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy", Key Engineering Materials, Vols. 206-213, pp. 1025-1028, 2002

Online since:

December 2001

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