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HomeKey Engineering MaterialsKey Engineering Materials Vols. 206-213Microstructural Differences in Silicon Nitrides...

Microstructural Differences in Silicon Nitrides with and without a Small Amount of TiN Additive

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Euro Ceramics VII

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Periodical:

Key Engineering Materials (Volumes 206-213)

Pages:

1181-1184

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.206-213.1181

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Online since:

December 2001

Authors:

Ren-Guan Duan, Gert Roebben, C. Sarbu, Jef Vleugels, Omer Van der Biest

Keywords:

High Temperature X-Ray Diffraction, Impulse Excitation Technique IET, Intergranular Glass Phase, Internal Friction, Thermal Expansion

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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