Effects of Low-Temperature Annealing on the Microstructure and Electrical Properties of Doped-ZnO Varistors

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Periodical:

Key Engineering Materials (Volumes 206-213)

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Edited by:

C. Kermel, V. Lardot, D. Libert and I. Urbain

Pages:

1389-1392

Citation:

P. Durán et al., "Effects of Low-Temperature Annealing on the Microstructure and Electrical Properties of Doped-ZnO Varistors", Key Engineering Materials, Vols. 206-213, pp. 1389-1392, 2002

Online since:

December 2001

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