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HomeKey Engineering MaterialsKey Engineering Materials Vols. 214-215Suppression of Interface Migration and Improvement...

Suppression of Interface Migration and Improvement of Dielectric Properties in SrTiO₃-Based Materials

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Asian Ceramic Science for Electronics I

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Periodical:

Key Engineering Materials (Volumes 214-215)

Pages:

61-66

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.214-215.61

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Online since:

July 2001

Authors:

Joo Sun Kim, Sang Yoon Koo, Suk Joong L. Kang

Keywords:

Barrier Layer Capacitor, Dielectric Property, Diffusion Induced Grain Boundary Migration DIGM, Infiltration, Strontium Titanate

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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