Suppression of Interface Migration and Improvement of Dielectric Properties in SrTiO3-Based Materials

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Periodical:

Key Engineering Materials (Volumes 214-215)

Edited by:

M. Murata, K. Koumoto and T. Takenaka, S. Fujitsu

Pages:

61-66

DOI:

10.4028/www.scientific.net/KEM.214-215.61

Citation:

J. S. Kim et al., "Suppression of Interface Migration and Improvement of Dielectric Properties in SrTiO3-Based Materials", Key Engineering Materials, Vols. 214-215, pp. 61-66, 2002

Online since:

July 2001

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$35.00

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