Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

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Periodical:

Key Engineering Materials (Volumes 224-226)

Edited by:

Jianghong Gong and Wei Pan

Pages:

505-510

DOI:

10.4028/www.scientific.net/KEM.224-226.505

Citation:

I. M. Low et al., "Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction", Key Engineering Materials, Vols. 224-226, pp. 505-510, 2002

Online since:

June 2002

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$35.00

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