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HomeKey Engineering MaterialsKey Engineering Materials Vols. 224-226Depth-Profiling of Phase Composition and Texture...

Depth-Profiling of Phase Composition and Texture in Layered-Graded Al₂O₃- & Ti₃SiC₂-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

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High-Performance Ceramics 2001

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Periodical:

Key Engineering Materials (Volumes 224-226)

Pages:

505-510

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.224-226.505

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Online since:

June 2002

Authors:

It Meng Low, M. Singh, P. Manurung, E. Wren, D.P. Sheppard, M.W. Barsoum

Keywords:

Depth Profiling, Grazing Incidence, Layered-Graded, Synchrotron Radiation Diffraction

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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