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HomeKey Engineering MaterialsKey Engineering Materials Vols. 228-229Mixture Behavior and Microwave Dielectric...

Mixture Behavior and Microwave Dielectric Properties in the CeO₂-V₂O₅ System

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Asian Ceramic Science for Electronics II and Electroceramics in Japan V

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Periodical:

Key Engineering Materials (Volumes 228-229)

Pages:

49-56

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.228-229.49

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Online since:

September 2002

Authors:

Duck Hwan Kim, Chul An

Keywords:

CeO₂, Dielectric Constant, Q*f, Sintering Temperature, Temperature Coefficient of the Resonant Frequency, V₂O₅

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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