Work Function Microscopy as a Tool for Materials Analysis

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Periodical:

Key Engineering Materials (Volumes 230-232)

Edited by:

Teresa Vieira

Pages:

165-168

Citation:

O. M.N.D. Teodoro and A. M.C. Moutinho, "Work Function Microscopy as a Tool for Materials Analysis", Key Engineering Materials, Vols. 230-232, pp. 165-168, 2002

Online since:

October 2002

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[3] G. Bachmann, H. Oechsner, J. Scholtes and Fresenius, Z. Anal. Chem., 329 (1987) p.195.

[4] A.P. Janssen, P. Akhter, C.J. Harland and J.A. Venables, Surf. Sci., 93 (1980) p.453.

[5] A. Benninghoven, F.G. Rüdenauer, H.W. Werner, Secondary Ion Mass Spectrometry, Chemical Analysis Series Vol 86 ed. P.J. Elving, J.D. Winefordner (Wiley, New York 1987).

[6] A.A. Dias, R. Carrapa, M.T. Barros, T. Almeida Gasche, O.M.N.D. Teodoro, M.L. Costa, M.H. Vasconcelos Cabral and A.M.C. Moutinho, Vacuum 64, (2002).

DOI: https://doi.org/10.1016/s0042-207x(01)00331-1

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