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HomeKey Engineering MaterialsKey Engineering Materials Vols. 230-232Work Function Microscopy as a Tool for Materials...

Work Function Microscopy as a Tool for Materials Analysis

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Periodical:

Key Engineering Materials (Volumes 230-232)

Pages:

165-168

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.230-232.165

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Online since:

October 2002

Authors:

Orlando M.N.D. Teodoro, Augusto M.C. Moutinho

Keywords:

Metal, Microscopy, Surface Analysis, Work Function

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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[1] G. Bachmann, W. Berthold and H. Oechsner, Thin Sol.Films, 174 (1989) p.149

[2] O.M.N.D. Teodoro, J.A.M.C. Silva and A.M.C. Moutinho, Vacuum 46, (1995) p.1205

[3] G. Bachmann, H. Oechsner, J. Scholtes and Fresenius, Z.Anal.Chem., 329 (1987) p.195

[4] A.P. Janssen, P. Akhter, C.J. Harland and J.A. Venables, Surf.Sci., 93 (1980) p.453

[5] A. Benninghoven, F.G. Rüdenauer, H.W. Werner, Secondary Ion Mass Spectrometry, Chemical Analysis Series Vol 86 ed. P.J. Elving, J.D. Winefordner (Wiley, New York 1987)

DOI: 10.1016/s0003-2670(00)85925-5

[6] A.A. Dias, R. Carrapa, M.T. Barros, T. Almeida Gasche, O.M.N.D. Teodoro, M.L. Costa, M.H. Vasconcelos Cabral and A.M.C. Moutinho, Vacuum 64, (2002) pp.445-6.5 7.0 7.5 8.0 Relative Work Function (eV) Figure 4- The removal of the barium layer on a Ba/Ag surface is very well observed by work function microscopy. The measured work function difference is about 2 eV in agreement with the known values for clean Ag and Ba on Ag.

DOI: 10.1016/s0042-207x(01)00331-1