ADI Behaviour under Twin-Disc Contact Fatigue Tests

Abstract:

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Periodical:

Key Engineering Materials (Volumes 230-232)

Edited by:

Teresa Vieira

Pages:

218-221

DOI:

10.4028/www.scientific.net/KEM.230-232.218

Citation:

A. Duarte et al., "ADI Behaviour under Twin-Disc Contact Fatigue Tests", Key Engineering Materials, Vols. 230-232, pp. 218-221, 2002

Online since:

October 2002

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Price:

$35.00

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